Automated Organization ProfilePhysikalisch-Technische Bundesanstalt (PTB), Berlin, Germany
Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany
Current S-Index
Sum of Dataset Indices for all datasets
Average Dataset Index per Dataset
Average Dataset Index per dataset
Total Datasets
Total datasets in this organization
Average FAIR Score
Average FAIR Score per dataset
Total Citations
Total citations to the organization's datasets
Total Mentions
Total mentions of the organization's datasets
S-Index Interpretation
The S-Index (Sharing Index) is a comprehensive metric that represents the cumulative impact of all your datasets. It is calculated as the sum of Dataset Index scores across all your claimed datasets.
What it means:
- A higher S-index indicates greater overall impact of your datasets relative to typical datasets in their fields of research
- The S-Index grows as you add more datasets or as existing datasets gain more citations and mentions
- It provides a single number to track your research data impact over time
Current S-Index: 7.1 (sum of 4 datasets Dataset Index scores)
More information here.
S-Index Over Time
Cumulative Citations Over Time
Cumulative Mentions Over Time
Datasets
We provide here the raw data used to produce the figures in the publication Egger et al. Angewandte Chemie International Edition 2021, 60, 1 – 6 , DOI: 10.1002/anie.202015187. All metadata necessary to analyze the data are contained in the files. 12042-Ag(100)--35Pe---Fermi.txt, 12046-Ag(100)--35Pe---Fermi.txt Angle-resolved photoemission spectroscopy data as acquired, used to produce Figures 3. Analysis program compatible with the format of these files can be requested from [email protected].
Authors
- Egger, Larissa ;
- Hollerer, Michael ;
- Kern, Christian S. ;
- Herrmann, Hannes ;
- Hurdax, Philipp ;
- Haags, Anja ;
- Xiaosheng Yang ;
- Gottwald, Alexander ;
- Richter, Mathias ;
- Soubatch, Serguei ;
- Tautz, F. Stefan ;
- Koller, Georg ;
- Puschnig, Peter ;
- Ramsey, Michael G. ;
- Sterrer, Martin
We provide here the raw data used to produce the figures in the publication Philipp Hurdax et al., Controlling the electronic and physical coupling on dielectric thin films, Beilstein J. Nanotechnol. 2020, 11, 1492–1503, doi: 10.3762/bjnano.11.132 All metadata necessary to analyze the data are contained in the files. 12612-Ag(100)--35Pe---Fermi.txt Angle-resolved photoemission spectroscopy data as acquired, used to produce figure 3a. 12613-Ag(100)--35Pe---Fermi.txt Angle-resolved photoemission spectroscopy data as acquired, used to produce figure 3b. Analysis program compatible with the format of these files can be requested from [email protected].
Authors
- Hurdax, Philipp ;
- Hollerer, Michael ;
- Egger, Larissa ;
- Koller, Georg ;
- Yang, Xiaosheng ;
- Haags, Anja ;
- Soubatch, Serguei ;
- Tautz, F. Stefan ;
- Richter, Mathias ;
- Gottwald, Alexander ;
- Puschnig, Peter ;
- Sterrer, Martin ;
- Ramsey, Michael G.
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.
Authors
- Andrle, Anna ;
- Hönicke, Philipp ;
- Vinson, Jon ;
- Quintanilha, Richard ;
- Saadeh, Qais ;
- Heidenreich, Sebastian ;
- Scholze, Frank ;
- Soltwisch, Victor
The refractive index of a y-cut SiO2 crystal surface is reconstructed from polarization dependent soft X-ray reflectometry measurements in the energy range from 45 eV to 620 eV. In the datasets the 1-delta and beta values for the (100) and (001) direction of the SiO2 crystal for the different energies are provided.
Authors
- Andrle, Anna ;
- Hönicke, Philipp ;
- Vinson, Jon ;
- Quintanilha, Richard ;
- Saadeh, Qais ;
- Heidenreich, Sebastian ;
- Scholze, Frank ;
- Soltwisch, Victor