Automated Author ProfileSujittra Youngme
Sujittra Youngme
Current S-Index
Sum of Dataset Indices for all datasets
Average Dataset Index per Dataset
Average Dataset Index per dataset
Total Datasets
Total datasets for this author
Average FAIR Score
Average FAIR Score per dataset
Total Citations
Total citations to the author's datasets
Total Mentions
Total mentions of the author's datasets
S-Index Interpretation
The S-Index (Sharing Index) is a comprehensive metric that represents the cumulative impact of all your datasets. It is calculated as the sum of Dataset Index scores across all your claimed datasets.
What it means:
- A higher S-index indicates greater overall impact of your datasets relative to typical datasets in their fields of research
- The S-Index grows as you add more datasets or as existing datasets gain more citations and mentions
- It provides a single number to track your research data impact over time
Current S-Index: 2.2 (sum of 5 datasets Dataset Index scores)
More information here.
S-Index Over Time
Cumulative Citations Over Time
Cumulative Mentions Over Time
Datasets
Abstract KxCryNi1-x-yO (x = 0.05-0.20, y = 0.02) dielectric materials were prepared using a facile simple green ultrasonic-assisted sol-gel method. All samples have a main phase consisting of a cubic NiO structure and with nanoscale crystallite sizes (28.58-37.51 nm). However, secondary phases were also observed for the samples with x values exceeding 0.10. The fractured surface microstructures of the samples with x values less than 0.15 exhibited uniformly distributed spherical grains. Other samples showed irregularly shaped grains. The grain sizes were larger when x was increased to 0.15 and exhibited increased grain growth probably due to substitution of K ions into the NiO lattice. However, a reduction of grain sizes was observed in the sample with x = 0.20, possibly due to inhibition of the grain growth by the secondary phase. At room temperature and a frequency of 1013 Hz, the highest dielectric constant of 2.25 × 104 was obtained for the samples with x = 0.15.
Authors
- Bualan Khumpaitool ;
- Songkot Utara ;
- Jinda Khemprasit ;
- Sujittra Youngme
Abstract KxCryNi1-x-yO (x = 0.05-0.20, y = 0.02) dielectric materials were prepared using a facile simple green ultrasonic-assisted sol-gel method. All samples have a main phase consisting of a cubic NiO structure and with nanoscale crystallite sizes (28.58-37.51 nm). However, secondary phases were also observed for the samples with x values exceeding 0.10. The fractured surface microstructures of the samples with x values less than 0.15 exhibited uniformly distributed spherical grains. Other samples showed irregularly shaped grains. The grain sizes were larger when x was increased to 0.15 and exhibited increased grain growth probably due to substitution of K ions into the NiO lattice. However, a reduction of grain sizes was observed in the sample with x = 0.20, possibly due to inhibition of the grain growth by the secondary phase. At room temperature and a frequency of 1013 Hz, the highest dielectric constant of 2.25 × 104 was obtained for the samples with x = 0.15.
Authors
- Bualan Khumpaitool ;
- Songkot Utara ;
- Jinda Khemprasit ;
- Sujittra Youngme
No description available
Authors
- Sujittra Youngme
No description available
Authors
- Sujittra Youngme