Automated Author ProfileShterk, G. (Genrikh)
0000-0002-9018-6560
Shterk, G. (Genrikh)
Current S-Index
Sum of Dataset Indices for all datasets
Average Dataset Index per Dataset
Average Dataset Index per dataset
Total Datasets
Total datasets for this author
Average FAIR Score
Average FAIR Score per dataset
Total Citations
Total citations to the author's datasets
Total Mentions
Total mentions of the author's datasets
S-Index Interpretation
The S-Index (Sharing Index) is a comprehensive metric that represents the cumulative impact of all your datasets. It is calculated as the sum of Dataset Index scores across all your claimed datasets.
What it means:
- A higher S-index indicates greater overall impact of your datasets relative to typical datasets in their fields of research
- The S-Index grows as you add more datasets or as existing datasets gain more citations and mentions
- It provides a single number to track your research data impact over time
Current S-Index: 12.6 (sum of 8 datasets Dataset Index scores)
More information here.
S-Index Over Time
Cumulative Citations Over Time
Cumulative Mentions Over Time
Datasets
Innovative approaches to study buried interfaces and heterogenous interactions under reaction conditions are crucial for advancing energy and catalytic materials. Our Near-Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) setup is equipped with a novel tri-color X-ray source, with Al Kα, Ag Lα, and Cr Kα excitation energies, enabling information depth-selective operando and in situ analysis of solid-liquid, solid-gas, and solid-solid interfaces. We present three case studies to demonstrate the systems’ capabilities. First, we compare experimental depth profiling of a LaMnO3/LaFeO3/Nb:SrTiO3 multilayer with SESSA simulations. Second, we examine the oxidation and reduction of FexOy as a function of environment and temperature. Finally, the Pt/liquid electrolyte interface is examined, revealing surface oxidation in the absence of bulk oxidation. As our results confirm, the unique combination of a NAP-XPS with the novel tri-color X-ray source empowers laboratory-based in situ and operando XPS characterization of advanced materials under reaction conditions in a wide range of applications.
Authors
- van den Bosch, Iris ;
- Uz Zaman, Jahid ;
- Shterk, G. (Genrikh) ;
- Hussein Hamed, Mai ;
- Schneider, Michael ;
- Ratovskii, Vadim ;
- Bu, Yibin ;
- Dietrich, Paul M. ;
- Koster, Gertjan ;
- Baeumer, Christoph
Innovative approaches to study buried interfaces and heterogenous interactions under reaction conditions are crucial for advancing energy and catalytic materials. Our Near-Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) setup is equipped with a novel tri-color X-ray source, with Al Kα, Ag Lα, and Cr Kα excitation energies, enabling information depth-selective operando and in situ analysis of solid-liquid, solid-gas, and solid-solid interfaces. We present three case studies to demonstrate the systems’ capabilities. First, we compare experimental depth profiling of a LaMnO3/LaFeO3/Nb:SrTiO3 multilayer with SESSA simulations. Second, we examine the oxidation and reduction of FexOy as a function of environment and temperature. Finally, the Pt/liquid electrolyte interface is examined, revealing surface oxidation in the absence of bulk oxidation. As our results confirm, the unique combination of a NAP-XPS with the novel tri-color X-ray source empowers laboratory-based in situ and operando XPS characterization of advanced materials under reaction conditions in a wide range of applications.
Authors
- van den Bosch, Iris ;
- Uz Zaman, Jahid ;
- Shterk, G. (Genrikh) ;
- Hussein Hamed, Mai ;
- Schneider, Michael ;
- Ratovskii, Vadim ;
- Bu, Yibin ;
- Dietrich, Paul M. ;
- Koster, Gertjan ;
- Baeumer, Christoph
Supplementary material: atomic concentrations calculated from XPS, XPS spectra
Authors
- Ticali, Pierfrancesco ;
- Morandi, Sara ;
- Shterk, Genrikh ;
- Ould-Chikh, Samy ;
- Ramirez, Adrian ;
- Gascon, Jorge ;
- Chung, Sang-Ho ;
- Ruiz-Martinez, Javier ;
- Bordiga, Silvia
Supplementary material: atomic concentrations calculated from XPS, XPS spectra
Authors
- Ticali, Pierfrancesco ;
- Morandi, Sara ;
- Shterk, Genrikh ;
- Ould-Chikh, Samy ;
- Ramirez, Adrian ;
- Gascon, Jorge ;
- Chung, Sang-Ho ;
- Ruiz-Martinez, Javier ;
- Bordiga, Silvia
Supplementary material: N2 adsorption, PXRD, IR, modelling, test results, XAS, SEM, PES, TEM
Authors
- Salusso, Davide ;
- Ahmad, Rafia ;
- Ahoba-Sam, Christian ;
- Ramirez, Adrian ;
- Shterk, Genrikh ;
- Lomachenko, Kirill ;
- Borfecchia, Elisa ;
- Morandi, Sara ;
- Cavallo, Luigi ;
- Gascon, Jorge ;
- Bordiga, Silvia ;
- Olsbye, Unni
Supplementary material: N2 adsorption, PXRD, IR, modelling, test results, XAS, SEM, PES, TEM
Authors
- Ticali, Pierfrancesco ;
- Salusso, Davide ;
- Ahmad, Rafia ;
- Ahoba-Sam, Christian ;
- Ramirez, Adrian ;
- Shterk, Genrikh ;
- Lomachenko, Kirill ;
- Borfecchia, Elisa ;
- Morandi, Sara ;
- Cavallo, Luigi ;
- Gascon, Jorge ;
- Bordiga, Silvia ;
- Olsbye, Unni
Supplementary material: N2 adsorption, PXRD, IR, modelling, test results, XAS, SEM, PES, TEM
Authors
- Ticali, Pierfrancesco ;
- Salusso, Davide ;
- Ahmad, Rafia ;
- Ahoba-Sam, Christian ;
- Ramirez, Adrian ;
- Shterk, Genrikh ;
- Lomachenko, Kirill ;
- Borfecchia, Elisa ;
- Morandi, Sara ;
- Cavallo, Luigi ;
- Gascon, Jorge ;
- Bordiga, Silvia ;
- Olsbye, Unni
The dataset contains the processed data of the publication with the above-mentioned title, published in Catalysis Science & Technology (https://doi.org/10.1039/D0CY00817F).
Authors
- Gascon, J. (Jorge) ;
- Franz, Robert ;
- Kühlewind, T. (Tobias) ;
- Shterk, G. (Genrikh) ;
- Abou-Hamad, E. (Edy) ;
- Parastaev, Alexander ;
- Uslamin, Evgeny ;
- Hensen, Emiel J.M. ;
- Kapteijn, F. (Freek) ;
- Pidko, Evgeny