This study introduces a new approach to addressing the positive and unlabeled (PU) data through the double exponential tilting model (DETM) under a transfer learning framework. Traditional methods often fall short because they only apply to the common distributions (CD) PU data (also known as the selected completely at random PU data), where the labeled positive and unlabeled positive data are assumed to be from the same distribution. In contrast, our DETM’s dual structure effectively accommodates the more complex and underexplored different distribution (DD) PU data (also known as the selected at random PU data), where the labeled and unlabeled positive data can be from different distributions. We rigorously establish the theoretical foundations of DETM, including identifiability, parameter estimation, and asymptotic properties. Additionally, we move forward to statistical inference by developing a goodness-of-fit test for the CD assumption and constructing confidence intervals for the proportion of positive instances in the target domain. We leverage an approximated Bayes classifier for classification tasks, demonstrating DETM’s robust performance in prediction. Through theoretical insights and practical applications, this study highlights DETM as a comprehensive framework for addressing the challenges of PU data.Supplementary materials for this article are available online, including a standardized description of the materials available for reproducing the work.

This study introduces a new approach to addressing the positive and unlabeled (PU) data through the double exponential tilting model (DETM) under a transfer learning framework. Traditional methods often fall short because they only apply to the common distributions (CD) PU data (also known as the selected completely at random PU data), where the labeled positive and unlabeled positive data are assumed to be from the same distribution. In contrast, our DETM’s dual structure effectively accommodates the more complex and underexplored different distribution (DD) PU data (also known as the selected at random PU data), where the labeled and unlabeled positive data can be from different distributions. We rigorously establish the theoretical foundations of DETM, including identifiability, parameter estimation, and asymptotic properties. Additionally, we move forward to statistical inference by developing a goodness-of-fit test for the CD assumption and constructing confidence intervals for the proportion of positive instances in the target domain. We leverage an approximated Bayes classifier for classification tasks, demonstrating DETM’s robust performance in prediction. Through theoretical insights and practical applications, this study highlights DETM as a comprehensive framework for addressing the challenges of PU data.Supplementary materials for this article are available online, including a standardized description of the materials available for reproducing the work.

This article introduces methods for constructing prediction bounds or intervals for the number of future failures from heterogeneous reliability field data. We focus on within-sample prediction where early data from a failure-time process is used to predict future failures from the same process. Early data from high-reliability products, however, often have limited information due to some combination of small sample sizes, censoring, and truncation. In such cases, we use a Bayesian hierarchical model to model jointly multiple lifetime distributions arising from different subpopulations of similar products. By borrowing information across subpopulations, our method enables stable estimation and the computation of corresponding prediction intervals, even in cases where there are few observed failures. Three applications are provided to illustrate this methodology, and a simulation study is used to validate the coverage performance of the prediction intervals.

This article introduces methods for constructing prediction bounds or intervals for the number of future failures from heterogeneous reliability field data. We focus on within-sample prediction where early data from a failure-time process is used to predict future failures from the same process. Early data from high-reliability products, however, often have limited information due to some combination of small sample sizes, censoring, and truncation. In such cases, we use a Bayesian hierarchical model to model jointly multiple lifetime distributions arising from different subpopulations of similar products. By borrowing information across subpopulations, our method enables stable estimation and the computation of corresponding prediction intervals, even in cases where there are few observed failures. Three applications are provided to illustrate this methodology, and a simulation study is used to validate the coverage performance of the prediction intervals.