Automated Author Profile

Scappucci, Giordano

Kavli Institue of NanoscienceQuTech

Current S-Index

3.6

Sum of Dataset Indices for all datasets

Average Dataset Index per Dataset

1.8

Average Dataset Index per dataset

Total Datasets

2

Total datasets for this author

Average FAIR Score

65.4%

Average FAIR Score per dataset

Total Citations

1

Total citations to the author's datasets

Total Mentions

0

Total mentions of the author's datasets

S-Index Interpretation

S-Index Over Time

Cumulative Citations Over Time

Cumulative Mentions Over Time

Datasets

Supporting Data for "Hamiltonian Phase Error in Resonantly Driven CNOT Gate Above the Fault-Tolerant Threshold" (Version: 1.0)

Supporting data for Wu, YH., Camenzind, L.C., Noiri, A. et al. Hamiltonian phase error in resonantly driven CNOT gate above the fault-tolerant threshold. npj Quantum Inf 10, 8 (2024). https://doi.org/10.1038/s41534-023-00802-9Abstract:Because of their long coherence time and compatibility with industrial foundry processes, electron spin qubits are a promising platform for scalable quantum processors. A full-fledged quantum computer will need quantum error correction, which requires high-fidelity quantum gates. Analyzing and mitigating gate errors are useful to improve gate fidelity. Here, we demonstrate a simple yet reliable calibration procedure for a high-fidelity controlled-rotation gate in an exchange-always-on Silicon quantum processor, allowing operation above the fault-tolerance threshold of quantum error correction. We find that the fidelity of our uncalibrated controlled-rotation gate is limited by coherent errors in the form of controlled phases and present a method to measure and correct these phase errors. We then verify the improvement in our gate fidelities by randomized benchmark and gate-set tomography protocols. Finally, we use our phase correction protocol to implement a virtual, high-fidelity, controlled-phase gate.

Authors

  • Yi-Hsien Wu ;
  • Camenzind, Leon ;
  • Noiri, Akito ;
  • Takeda, Kenta ;
  • Nakajima, Takashi ;
  • Kobayashi, Takashi ;
  • Chang, Chien-Yuan ;
  • Sammak, Amir ;
  • Scappucci, Giordano ;
  • Goan, Hsi-Sheng ;
  • Tarucha, Seigo
0 Citations0 Mentions65% FAIR1.6 Dataset Index
10.5281/zenodo.79279082024

Supporting Data for "Hamiltonian Phase Error in Resonantly Driven CNOT Gate Above the Fault-Tolerant Threshold" (Version: 1.0)

Supporting data for Wu, YH., Camenzind, L.C., Noiri, A. et al. Hamiltonian phase error in resonantly driven CNOT gate above the fault-tolerant threshold. npj Quantum Inf 10, 8 (2024). https://doi.org/10.1038/s41534-023-00802-9Abstract:Because of their long coherence time and compatibility with industrial foundry processes, electron spin qubits are a promising platform for scalable quantum processors. A full-fledged quantum computer will need quantum error correction, which requires high-fidelity quantum gates. Analyzing and mitigating gate errors are useful to improve gate fidelity. Here, we demonstrate a simple yet reliable calibration procedure for a high-fidelity controlled-rotation gate in an exchange-always-on Silicon quantum processor, allowing operation above the fault-tolerance threshold of quantum error correction. We find that the fidelity of our uncalibrated controlled-rotation gate is limited by coherent errors in the form of controlled phases and present a method to measure and correct these phase errors. We then verify the improvement in our gate fidelities by randomized benchmark and gate-set tomography protocols. Finally, we use our phase correction protocol to implement a virtual, high-fidelity, controlled-phase gate.

Authors

  • Yi-Hsien Wu ;
  • Camenzind, Leon ;
  • Noiri, Akito ;
  • Takeda, Kenta ;
  • Nakajima, Takashi ;
  • Kobayashi, Takashi ;
  • Chang, Chien-Yuan ;
  • Sammak, Amir ;
  • Scappucci, Giordano ;
  • Goan, Hsi-Sheng ;
  • Tarucha, Seigo
1 Citation0 Mentions65% FAIR2.0 Dataset Index
10.5281/zenodo.79279072024