Automated Author Profile

Heejae Kim

Current S-Index

12.4

Sum of Dataset Indices for all datasets

Average Dataset Index per Dataset

1.2

Average Dataset Index per dataset

Total Datasets

10

Total datasets for this author

Average FAIR Score

50.0%

Average FAIR Score per dataset

Total Citations

0

Total citations to the author's datasets

Total Mentions

0

Total mentions of the author's datasets

S-Index Interpretation

S-Index Over Time

Cumulative Citations Over Time

Cumulative Mentions Over Time

Datasets

SAIT_semiconductors_ACS_2023_SiN_validation (Version: 0)

Validation configurations from the SAIT_semiconductors_ACS_2023_SiN dataset. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/1eaf36bfJanuary 2024

SAIT_semiconductors_ACS_2023_SiN_train (Version: 0)

Training configurations from the SAIT_semiconductors_ACS_2023_SiN dataset. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/dbe982a6January 2024

SAIT_semiconductors_ACS_2023_HfO_validation (Version: 0)

Validation configurations from the SAIT_semiconductors_ACS_2023_HfO dataset. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/bde379deJanuary 2024

SAIT_semiconductors_ACS_2023_HfO_out-of-domain (Version: 0)

Out-of-domain configurations from the SAIT_semiconductors_ACS_2023_HfO dataset. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/83a90e9cJanuary 2024

SAIT_semiconductors_ACS_2023_HfO_test (Version: 0)

Test configurations from the SAIT_semiconductors_ACS_2023_HfO dataset. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/e7100354January 2024

SAIT_semiconductors_ACS_2023_HfO_raw (Version: 0)

Structures from the SAIT_semiconductors_ACS_2023_HfO dataset, separated into crystal, out-of-domain, and random (generated by randomly distributing 32 Hf and 64 O atoms within the unit cells of the HfO2 crystals) configuration sets. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/186c10bfJanuary 2024

SAIT_semiconductors_ACS_2023_SiN_out-of-domain (Version: 0)

Out-of-domain configurations from the SAIT_semiconductors_ACS_2023_SiN dataset. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/c2179a59January 2024

SAIT_semiconductors_ACS_2023_SiN_test (Version: 0)

Test configurations from the SAIT_semiconductors_ACS_2023_SiN dataset. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/821cd3a8January 2024

SAIT_semiconductors_ACS_2023_SiN_raw (Version: 0)

Structures from the SAIT_semiconductors_ACS_2023_SiN dataset, separated into N-only, Si-only, SiN, and out-of-domain melt, quench and relax configuration sets. This dataset contains SiN, Si and N configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/ef14d3daJanuary 2024

SAIT_semiconductors_ACS_2023_HfO_train (Version: 0)

Training configurations from the SAIT_semiconductors_ACS_2023_HfO dataset. This dataset contains HfO configurations from the SAIT semiconductors datasets. SAIT semiconductors datasets comprise two rich datasets for the important semiconductor thin film materials silicon nitride (SiN) and hafnium oxide (HfO), gathered for the development of MLFFs. DFT simulations were conducted under various conditions that include differing initial structures, stoichiometry, temperature, strain, and defects.

Authors

  • Geonu Kim ;
  • Byunggook Na ;
  • Gunhee Kim ;
  • Hyuntae Cho ;
  • Seung-Jin Kang ;
  • Lee, Hee Sun ;
  • Saerom Choi ;
  • Heejae Kim ;
  • Seungwon Lee ;
  • Yongdeok Kim
0 Citations0 Mentions50% FAIR1.2 Dataset Index
10.60732/495b736bJanuary 2024