Version 1.2

Replication Data for: High-Throughput Optical Thickness and Size Characterization of 2D Materials

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Schniepp, Hannes;Dickinson, W. W.

Description

<p>This is the optical microscopy raw data and processed data to our published manuscript. Our code used for analysis has been published in the supporting information of the manuscript, but can also be found <a href='https://gitlab.com/schniepp-lab/invert-mountain'>here</a>. The data here can be used to test the code and reproduce the published results. </p><p>The dataset is best viewed in "tree" mode, because it contains >1000 files, which are organized in folders. The following items are in the root folder: <ul><li><b><i>GO</i></b>, <b><i>GOe</i></b>, <b><i>GOw</i></b> folders: data from three different samples as discussed in the manuscript</li><li><b><i>ParticleAnalysis-Histograms_and_Data.qti</i></b>: analyzed histograms and derived plots, as used in the manuscript (<a href='https://en.wikipedia.org/wiki/QtiPlot'>QtiPlot</a> format)</li></ul></p><p>Each of the three folders with sample data has subfolders <b><i>Raw images</i></b> (PNG format) and <b><i>Processed images</i></b> (TIFF and ASCII formats). The latter folder contains files of different stages of the processing process:<ul><li><b><i>Averaged:</i></b> Average of raw images</li><li><b><i>EmptySubstrateDivided:</i></b> Image after division by empty substrate</li><li><b><i>EmptySubstrateDivided-GwyddionExport:</i></b> Same as previous, but in Gwyddion text (ASCII) image format</li><li><b><i>ExtractedBackground:</i></b> Fitted plane in Gwyddion text (ASCII) format</li><li><b><i>Final:</i></b> Image after division by fitted plan</li><li><b><i>Final-Inverted:</i></b> Final image after inversion (may not be present if inversion not required)</li></ul></p>

Citations (1)

Mentions (0)

Metrics

Dataset Index

0.7

FAIR Score

15%

Citations

1

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Harvard Dataverse

Assigned Domain

Subfield

Electrical and Electronic Engineering

Field

Engineering

Domain

Physical Sciences

Confidence Score

95%

Source

Open Alex

Keywords

ChemistryEngineeringPhysicsgraphene2D materialsoptical characterization

Normalization Factors

FT

13.46

CTw

1.00

MTw

1.00