Materials Experiment and Analysis Database: X-ray diffraction measurements containing 5 files performed on plate containing V,Bi,Cu,Ar,O annealed at 610.0C to add O on 2017-10-07 from Run 20171006.170653

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Soedarmadji, Edwin;Gregoire, John

Description

This record is a component of the Materials Experiment andAnalysis Database (MEAD). It contains raw data and metadata from millions of materials synthesis and characterization experiments, as well as the analysis and distillation of that data into property and performance metrics. The unprecedented quantity and diversity of experimental data are searchable by experiment and analysis attributes generated by both researchers and data processing software.

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.2

FAIR Score

35%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Caltech Joint Center for Artificial Photosynthesis High Throughput Experimentation Project

License

cc-by-sa-4.0

Assigned Domain

Subfield

Biophysics

Field

Biochemistry, Genetics and Molecular Biology

Domain

Life Sciences

Confidence Score

55%

Source

Open Alex

Keywords

Caltech HTE measurementBiCuOVx-ray diffractionoxide

Normalization Factors

FT

57.69

CTw

1.00

MTw

1.00