Published on 01 January 2021

Materials Experiment and Analysis Database: X-ray diffraction measurements 2 files performed on plate containing Cu,Ca,V,Ar,O annealed at 550.0C to add O on 2018-02-27 from Run 20180227.114246

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Soedarmadji, Edwin;Gregoire, John

Description

This record is a component of the Materials Experiment andAnalysis Database (MEAD). It contains raw data and metadata from millions of materials synthesis and characterization experiments, as well as the analysis and distillation of that data into property and performance metrics. The unprecedented quantity and diversity of experimental data are searchable by experiment and analysis attributes generated by both researchers and data processing software.

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.8

FAIR Score

35%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Caltech Joint Center for Artificial Photosynthesis High Throughput Experimentation Project

Assigned Domain

Subfield

Artificial Intelligence

Field

Computer Science

Domain

Physical Sciences

Confidence Score

50%

Source

Scholar Data Model

Keywords

Caltech HTE measurementCaCuOVx-ray diffractionoxide

Normalization Factors

FT

15.38

CTw

1.00

MTw

1.00