XRD analysis of vacuum-filtered MXene film - PANalytical X'Pert Pro

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Bird, James

Description

An attempt is made to characterise the crystallographic texture of a vacuum-filtered Ti3C2 MXene film and verify composition/purity using Rietveld refinement.
For full experimental details and description of uploaded data, see the uploaded .pdf.

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.6

FAIR Score

88%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

University of Manchester

License

Creative Commons Attribution 4.0 International

Assigned Domain

Subfield

Materials Chemistry

Field

Materials Science

Domain

Physical Sciences

Confidence Score

36%

Source

Scholar Data Model

Keywords

Nanomaterials

Normalization Factors

FT

50.00

CTw

1.00

MTw

1.00