ECCOE 2023 Surface Reflectance Validation Dataset

Travis J Kropuenske;Jeffrey R Irwin;Mahesh Shrestha;Jason J Mann;Garrison L Gross

Description

Scientists and engineers from the U.S. Geological Survey (USGS) Earth Resources Observation and Science Center (EROS) Cal/Val Center of Excellence (ECCOE) collected in situ measurements using field spectrometers to support the validation of surface reflectance products derived from Earth observing remote sensing imagery. Data provided in this data release were collected during select Earth observing satellite overpasses during the months of May through November 2023 at the USGS EROS facility in Minnehaha County, South Dakota. Each field collection file includes the calculated surface reflectance of each wavelength collected using a dual field spectrometer methodology. The dual field spectrometer methodology allows for the calculated surface reflectance of each wavelength to be computed using one or both of the spectrometers. The use of the dual field spectrometers system reduces uncertainty in the field measurements by accounting for changes in solar irradiance. Both single and dual spectrometer calculated surface reflectance are included with this dataset. The differing methodologies of the calculated surface reflectance data are denoted as "Single Spectrometer" and "Dual Spectrometer". Field spectrometer data are provided as Comma Separated Values (CSV) files and GeoPackage files.

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.3

FAIR Score

53%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

U.S. Geological Survey

License

Creative Commons Zero v1.0 Universal

Assigned Domain

Subfield

Radiology, Nuclear Medicine and Imaging

Field

Medicine

Domain

Health Sciences

Confidence Score

53%

Source

Scholar Data Model

Keywords

Remote SensingLandsatimageryBaseMapsEarthCoverLandsat Level 2Landsat 8Environmental Mapping and Analysis ProgramSurface ReflectanceSurface Reflectance ValidationLandsat 9Field SpectrometerEnMAPSentinel 2

Normalization Factors

FT

63.46

CTw

1.00

MTw

1.00