Published on 09 April 2025
Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study: manuscript data
View DatasetYin, Shenwei;Cho, Jin-Woo;Feng, Demeng;Mei, Hongyan;Kumar, Tanuj;Wan, Chenghao;Jin, Yeonghoon;Kim, Minjeong;Kats, Mikhail
Description
Relevant data files for "Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study"
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Publication Details
Subfield
Biomedical Engineering
Field
Engineering
Domain
Physical Sciences
Confidence Score
53%
Source
Scholar Data Model