Published on 05 September 2024

Parallel-beam 4D-STEM tilt series on the metal-organic framework UiO-66

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Saha, Ambarneil;Ercius, Peter

Description

This repository contains data from scanning nanobeam electron diffraction experiments acquired using the 4D Camera installed on the double-aberration-corrected TEAM 0.5 instrument at NCEM.Each directory contains a tilt series of consecutive 4D-STEM scans acquired on a conglomerate of eight UiO-66 nanocrystals, alongside a sequence of simultaneously acquired HAADF images. A near-parallel probe was formed by using a custom 10 μm C2 aperture (Norcada) to access a range of narrow (<0.1 mrad) semiconvergence angles. Using a custom DigitalMicrograph script, 4D-STEM data were acquired in increments of 1 degree with the 4D Camera operating at 87000 frames per second. Each dataset is comprised of 512×512 probe positions and 576×576 detector pixels, resulting in 174 GB of raw data per scan. These raw data were counted and reduced to a sparse, linear-index-encoded electron event representation (EER) in HDF5 format on the NERSC supercomputer, Perlmutter, using the open-source software package stempy. These sparse HDF5 files can be interactively viewed using our open-source python-based software, DuSC Explorer.Experimental parameters for UiO-66:Accelerating voltage300 kVSemiconvergence angle0.07 mradScan dimensions512×512Real-space step size6.45 nmEstimated probe size (FWHM)14.4 nmTotal illuminated area22.1 μm^2Estimated fluence per probe position1 e- Å^(-2)Total size of raw data12180 GBTotal size of sparsified data10.5 GB

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Metrics

Dataset Index

0.1

FAIR Score

13%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Zenodo

Assigned Domain

Subfield

Structural Biology

Field

Biochemistry, Genetics and Molecular Biology

Domain

Life Sciences

Confidence Score

45%

Source

Scholar Data Model

Keywords

4D-STEMelectron crystallography

Normalization Factors

FT

30.77

CTw

1.00

MTw

1.00