Version 1

P35 - CrN Rough Sample - Universidad Nacional del Sur

Prieto, Germán ;Abdelnabe, Juan Pablo;Tuckart, Walter

Description

Equipment: Carl Zeiss Smartproof 5. The measurements were performed using a 20x objective (C Epiplan Apochromat 20X / NA 0.7 DIC 422652-9900) in a single field of view. Lateral dimensions: 553.12 x 553.12 um. Light wavelength: 405 nm. Acquisition software: ZEISS Efficient Navigation (ZEN). Measurement software: ConfoMap ST 7.4.8076.

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Metrics

Dataset Index

0.2

FAIR Score

31%

Citations

Mentions

Metrics Over Time

Publication Details

DOI

10.57703/ce-mnjjn

Publisher

contact.engineering

License

Creative Commons Attribution 4.0 International

Assigned Domain

Subfield

Electrical and Electronic Engineering

Field

Engineering

Domain

Physical Sciences

Confidence Score

38%

Source

Scholar Data Model

Keywords

FOS: Materials engineering

Normalization Factors

63.46

CTw

1.00

MTw

1.00