Version 2
Delplanque, Emilie;Cayer-Barrioz, Juliette;Mazuyer, Denis

Description

AFM and Bruker interferometer

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.1

FAIR Score

31%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

contact.engineering

License

Creative Commons Attribution 4.0 International

Assigned Domain

Subfield

General Materials Science

Field

Materials Science

Domain

Physical Sciences

Confidence Score

38%

Source

Scholar Data Model

Keywords

FOS: Materials engineering

Normalization Factors

FT

73.08

CTw

1.00

MTw

1.00