<b>Supplementary material for "Neural network-based and analytical solutions for damped vibration investigation of the functionally graded nanoplates on viscoelastic foundations</b><b>"</b>

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Vinh, Phạm Văn

Description

This study develops a hybrid computational framework combining analytical modeling and artificial neural network (ANN)-based prediction for damped vibration analysis of functionally graded nanoplates resting on viscoelastic foundations. This foundation model is an extension of the visco-Pasternak foundation with two stiffness parameters and two damping coefficients. The nanoplates, composed of a mixture of ceramic and metal, are modeled using higher-order shear deformation theory and modified nonlocal strain gradient theory. This theory accounts simultaneously for nonlocal and strain gradient effects. A closed-form analytical solution based on Navier’s method is derived from the exact solutions, while the ANN is used as a fast and efficient tool for approximate predictions. Extensive simulations are conducted to investigate the influence of foundation parameters, material gradation, geometric configurations, and small-scale coefficients on the dynamic behavior of the nanoplates. The proposed methodology demonstrates an effective integration of physics-based modeling with data-driven techniques, offering a computationally efficient tool for simulation-based analysis in nano-engineering applications.

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Metrics

Dataset Index

0.5

FAIR Score

85%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

figshare

License

Creative Commons Attribution 4.0 International

Assigned Domain

Subfield

Plant Science

Field

Agricultural and Biological Sciences

Domain

Life Sciences

Confidence Score

53%

Source

Open Alex

Keywords

Dynamics, vibration and vibration controlMechanical engineering not elsewhere classifiedMicroelectromechanical systems (MEMS)Numerical modelling and mechanical characterisationSolid mechanicsMicro- and nanosystemsNanoelectromechanical systemsNanomaterialsNanometrologyNanoscale characterisationFunctional materialsComposite and hybrid materials

Normalization Factors

FT

53.85

CTw

1.00

MTw

1.00