Matching_WB.tab

Bayer, Patrick (University Of Glasgow); Marcoux, Chris (UNC Charlotte); Urpelainen, Johannes (SAIS Johns Hopkins)

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Dataset Index

0.4

FAIR Score

58%

Citations

Mentions

DOI

Publisher

Harvard Dataverse

Subfield

Electrical and Electronic Engineering

Field

Engineering

Domain

Physical Sciences

Confidence Score

27%

Source

Scholar Data Model

44.23

CTw

1.00

MTw

1.00