x-ray diffraction for iron oxide

yasoob, Noor;Jumaa

Description

This dataset contain the XRD data for the prepared iron oxid, that synthesized via electrochemical deposition for the figures (6,7,8) in manuscript [Cold Plasma as a Novel Annealing Technique: A Comparative Study with Thermal Annealing on the Structural and Morphological Properties of Nickel and Iron Oxide]. Were measured using X-ray diffraction instrument from the Netherlands by Philips Company (PW1730).

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.4

FAIR Score

85%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Zenodo

License

Creative Commons Attribution 4.0 International

Assigned Domain

Subfield

Renewable Energy, Sustainability and the Environment

Field

Energy

Domain

Physical Sciences

Confidence Score

66%

Source

Scholar Data Model

Keywords

Cold plasmaAnnealingXRD for nickelAFM for NickelXRD for iron oxideAFM for Iron oxide

Normalization Factors

FT

63.46

CTw

1.00

MTw

1.00