IODP Expedition 324 X-ray diffraction (XRD)
Sager, William W.;Sano, Takashi;Geldmacher, Jorg;Almeev, Renat;Ando, Atsushi;Carvallo, Claire;Delacour, Adélie G.;Evans, Helen F.;Greene, Andrew R.;Harris, Amber C.;Herrmann, Sandra;Heydolph, Ken;Hirano, Naoto;Ishikawa, Akira;Iturrino, Gerardo J.;Kang, Moo Hee;Koppers, Anthony A.P.;Li, Sanzhong;Littler, Kate;Mahoney, John J.;Matsubara, Noritaka;Miyoshi, Masaya;Murphy, David T.;Natland, James H.;Ooga, Masahiro;Prytulak, Julie;Tominaga, Masako;Widdowson, Mike;Woodard, Stella C.
Description
X-ray diffraction (XRD) is used to identify minerals and their proportions in sediment or hard rock sample powders on a Bruker AXS D4 Endeavor X-ray diffractometer. Results are returned as diffractograms in a viewable format (either PDF or PNG).
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Metrics Over Time
Publication Details
DOI
Publisher
International Ocean Discovery Program
Subfield
Materials Chemistry
Field
Materials Science
Domain
Physical Sciences
Confidence Score
48%
Source
Scholar Data Model
Keywords
Integrated Ocean Drilling ProgramIODPJOIDES ResolutionExpedition 324Site U1346Site U1347Site U1348Site U1349Site U1350Shatsky Riseoceanic plateau