Materials Experiment and Analysis Database: Electrochemistry analysis, Electrochemistry measurements, Material library with Sb,Mn,Ar,O, Optical spectroscopy analysis, Optical spectroscopy measurements, X-ray diffraction analysis, X-ray diffraction measurements, X-ray fluorescence analysis, X-ray fluorescence measurements on plate(s) 3072

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Soedarmadji, Edwin;Gregoire, John

Description

This record is a component of the Materials Experiment andAnalysis Database (MEAD). It contains raw data and metadata from millions of materials synthesis and characterization experiments, as well as the analysis and distillation of that data into property and performance metrics. The unprecedented quantity and diversity of experimental data are searchable by experiment and analysis attributes generated by both researchers and data processing software.

Citations (0)

Mentions (0)

Metrics

Dataset Index

0.4

FAIR Score

69%

Citations

0

Mentions

0

Metrics Over Time

Publication Details

DOI

Publisher

Caltech Joint Center for Artificial Photosynthesis High Throughput Experimentation Project

License

cc-by-sa-4.0

Assigned Domain

Subfield

Radiation

Field

Physics and Astronomy

Domain

Physical Sciences

Confidence Score

72%

Source

Scholar Data Model

Keywords

Caltech HTE analysisCaltech HTE experimentCaltech HTE libraryCaltech HTE measurementMnOPVDSbelectrochemistryoptical spectroscopyoxidex-ray diffractionx-ray fluorescence

Normalization Factors

FT

65.38

CTw

1.00

MTw

1.00