Vibrational EELS Linescans

Scanning Transmission Electron Microscopy (STEM) Vibrational Electron Energy Loss Spectroscopy (EELS) line scans across silicon atomic columns. The scan direction followed the [110] crystallographic direction of the material. A linescan across a silicon/silicon dioxide interface is also included. Simultaneously acquired high angle annular dark field (HAADF) signals are also included for each EELS line scan.

Details of the acquisition of the data can be found in the related article in Nature Physics by Venkatraman, Levin, March, Rez & Crozier. A link to article is given below.