2021

XAFS spectrum of Tantalum silicide

Industrial Application and Partnership Division

Description

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta K-edge of Tantalum silicide measured at SPring-8 BL14B2, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR

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Metrics

Dataset Index

0.6

FAIR Score

85%

Citations

Mentions

Metrics Over Time

Publication Details

DOI

10.48505/nims.2875

Publisher

Industrial Application and Partnership Division, SPring-8

License

Creative Commons Attribution Non Commercial Share Alike 4.0 International

Assigned Domain

Subfield

Materials Chemistry

Field

Materials Science

Domain

Physical Sciences

Confidence Score

43%

Source

Scholar Data Model

Keywords

collection - MDR XAFS DBXAFSSPring-8BL14B2Si(311)TaSi2Ta K-edgeSilicideTantalum silicide

Normalization Factors

50.00

CTw

1.00

MTw

1.00