Published on 01 January 2021

XAFS spectrum of Tantalum nitride

Industrial Application and Partnership Division

Description

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Ta L21-edge of Tantalum nitride measured at SPring-8 BL14B2, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR

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Metrics

Dataset Index

0.6

FAIR Score

85%

Citations

Mentions

Metrics Over Time

Publication Details

DOI

10.48505/nims.2927

Publisher

Industrial Application and Partnership Division, SPring-8

Assigned Domain

Subfield

Radiation

Field

Physics and Astronomy

Domain

Physical Sciences

Confidence Score

37%

Source

Scholar Data Model

Keywords

collection - MDR XAFS DBXAFSSPring-8BL14B2Si(111)Ta3N5Ta L21-edgeNitrideTantalum nitride

Normalization Factors

48.08

CTw

1.00

MTw

1.00