Published on 01 January 2005

X-ray fluorescence on samples of ODP Hole 148-504B

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Alt, Jeffrey C;Kinoshita, Hajimu;Shipboard Scientific Party

Description

No description available.

Citations (0)

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Mentions (0)

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Metrics

Dataset Index

0.3

FAIR Score

13%

Citations

Mentions

Metrics Over Time

Publication Details

DOI

10.1594/pangaea.271364

Publisher

PANGAEA

Assigned Domain

Subfield

Renewable Energy, Sustainability and the Environment

Field

Energy

Domain

Physical Sciences

Confidence Score

66%

Source

Scholar Data Model

Keywords

DEPTH, sediment/rockDepth, compositeSample code/labelSample commentLoss on ignitionSilicon dioxideTitanium dioxideAluminium oxideIron oxide, Fe2O3Manganese oxideMagnesium oxideCalcium oxideSodium oxidePhosphorus pentoxideNiobiumZirconiumYttriumStrontiumRubidiumZincCopperNickelChromiumVanadiumCeriumBariumCommentDrilling/drill rigDSDP/ODP/IODP sample designationX-ray fluorescence (XRF)Leg148Joides ResolutionOcean Drilling Program (ODP)

Normalization Factors

13.46

CTw

1.00

MTw

1.00